White beam Laue topography using a scintillator-CCD combination

Using a scintillator-CCD imaging system, we successfully conducted a synchrotron white beam Laue topography (WBLT) experiment. It is demonstrated that this approach is able to provide a high-resolution microtopograph of p/p+ Si (1 0 0). Optimum condition for high-resolution imaging is obtainable from the incident angle dependence of geometrical resolution. Black and white dislocation contrast suggests the potential of WBLT in characterizing dislocation structure.