Emission probabilities of K X- and γ-rays following 51Cr and 67Ga decay

Emission probabilities of K X- and γ-rays following the decay of 51Cr and 67Ga were precisely measured with a calibrated Si(Li) detector. The photopeak efficiency of the Si(Li) semiconductor detector was determined experimentally for about 4-400 keV energy range by using standard sources. Results of this study have been compared with the theoretical values and other available experimental results in the literature. Good agreement was observed between our results, and other available experimental results and theoretically calculated values.