کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
11007122 | 1518284 | 2018 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Integrated contrast-transfer-function for aberration-corrected phase-contrast STEM
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
We describe the optical conditions that are essentially necessary for phase-contrast imaging with aberration-corrected scanning transmission electron microscopy (STEM), whose depth of field has reached almost comparable to the specimen thickness. For such state-of-the-art STEM, contrast-transfer-function (CTF) should be defined not solely for the projected potential but multiply for each wavefront during the beam propagation across the specimen thickness; an integration of multiple CTFs (iCTF). We show that the iCTF concept explains fairly well characteristic annular-bright-field (ABF) imaging behaviors of heavy/light atom sites against the defocus changes, and also provide notable concerns on possible artifacts that arise from different imaging-depth dependences between the heavy/light atom sites.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 194, November 2018, Pages 193-198
Journal: Ultramicroscopy - Volume 194, November 2018, Pages 193-198
نویسندگان
Takehito Seki, Naoto Takanashi, Eiji Abe,