کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
11008819 | 1840431 | 2018 | 18 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Resonant inelastic X-ray scattering of tantalum double perovskite structures
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
In this paper, we investigated the electronic structures and defect states of SrLaMgTaO6 (SLMTO) double perovskite structures by using resonant inelastic x-ray scattering. Recently, Eu3+ doped SLMTO red phosphors have been vigorously investigated due to their higher red emission efficiency compared to commercial white light emitting diodes (W-LED). However, a comprehensive understanding on the electronic structures and defect states of host SLMTO compounds, which are specifically related to the W-LED and photoluminescence (PL), is far from complete. Here, we found that the PL spectra of SLMTO powder compounds sintered at a higher temperature, 1400â¯Â°C, were weaker in the blue emission regions (at around 400â¯nm) and became enhanced in near infrared (NIR) regions compared to those sintered at 1200â¯Â°C. To elucidate the difference of the PL spectra, we performed resonant inelastic x-ray spectroscopy (RIXS) at Ta L-edge. Our RIXS result implies that the microscopic origin of different PL spectra is not relevant to the Ta-related defects and oxygen vacancies.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Current Applied Physics - Volume 18, Issue 11, November 2018, Pages 1225-1229
Journal: Current Applied Physics - Volume 18, Issue 11, November 2018, Pages 1225-1229
نویسندگان
Ju Hyun Oh, Jung Ho Kim, Jung Hyun Jeong, Seo Hyoung Chang,