کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
11016458 | 1777112 | 2018 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Voltage oscillations during surge pulses induced by self-extinguishing non-destructive second breakdown in pn-junction diodes
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
PN-junction diodes with different breakdown voltages have been subjected to surge pulses per the standard IEC 61000-4-5 and their transient behaviour has been studied. For medium breakdown voltages (20-40â¯V) at high surge currents large transient oscillations in the voltage drop across the diodes are observed. After such an event, the devices are still operational. 3D electro-thermal TCAD simulations have been done to understand the phenomenon. A comparison between measurement and simulation reveals that the periodic voltage drop is caused by non-destructive second breakdown.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volumes 88â90, September 2018, Pages 208-213
Journal: Microelectronics Reliability - Volumes 88â90, September 2018, Pages 208-213
نویسندگان
Steffen Holland, Rolf Brenner,