Dissociative photoionization of the tetramethyl silane molecule, Si(CH3)4, around the Si 1s edge

Photoionization of the Si[CH3]4 molecule has been studied around the Si 1s edge, using time-of-flight mass spectrometry, photoelectron–photoion coincidence techniques (PEPICO, PE2PICO and PE3PICO) and synchrotron radiation. Partial ion yields have been recorded as a function of the photon energy. Strong fragmentation of the molecule is observed and singly charged species (H+, H2+, C+, and CHn+) dominate the spectra, with the H+ ion being the most abundant fragment. Although the contribution of stable doubly and triply charged species was not significant in the measured spectra, intense double and triple ionization of the molecule was demonstrated below and above the Si 1s edge, through PE2PICO and PE3PICO measurements.