Application of ToF-SIMS to the study of surfactant removal from AuNbMCM-41 and AuMCM-41 materials

This work is focused on the application of time-of-flight secondary ion mass spectrometry (ToF-SIMS) in investigation of the surfactant removal process from AuNbMCM-41 and AuMCM-41 catalysts (MCM-41 “Mobil Composition of Matter”, ordered mesoporous materials discovered by Mobil R&D Corporation). The samples investigated were prepared by co-precipitation in the presence of a cationic surfactant (cetyltrimethylammonium chloride—CH3(CH2)15N(Cl)(CH3)3) and the incipient wetness impregnation methods. The results obtained showed that the time-of-flight secondary ion mass spectrometry appears to be a very useful tool for the investigation of the residual organic template on the surface of ordered mesoporous materials of MCM-41 type. It was demonstrated that the calcination of AuNbMCM-41 and AuMCM-41 catalysts at 550 °C caused a complete removal of the surfactant from the surface of the material investigated. Moreover, it was shown that the use of bismuth liquid metal ion gun in ToF-SIMS experiments permitted obtaining higher emission intensity (more than one order of magnitude when compared to the Ga+ primary ion source) of secondary ions originating from the surfactant molecules and may facilitate an interpretation of the results obtained.

This work is focused on the application of time-of-flight secondary ion mass spectrometry in investigation of the surfactant removal process from AuNbMCM-41 and AuMCM-41 catalysts.Figure optionsDownload as PowerPoint slide