کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1236400 | 968868 | 2010 | 6 صفحه PDF | دانلود رایگان |
Bulk single crystals of pure and metal ions (Mn2+, Cu2+ and Ni2+) doped sulphamic acid (SA) have been grown by conventional and unidirectional solution growth methods. Intensities of powder X-ray diffraction peaks of metal ions doped SA reveal that these dopants enhanced the crystallanity. The peak broadening and intensity variation in some frequency regions in FT-IR spectra show the incorporation of dopants in the SA lattice. Mn2+ and Cu2+ doped SA single crystals show high crystalline perfection (FWHM 5.5 arc s) compared to pure and Ni2+ metal ions doped SA crystals. The grown pure and Mn2+, Cu2+ and Ni2+ ions doped SA crystals have transparency in the order SA > Mn:SA > Cu:SA > Ni:SA. The hardness value of Ni2+ doped crystal is relatively less than that of the pure and other metal ions doped SA crystals. Pure and Ni2+ ions doped SA crystals possess high dielectric constants than that of Cu2+ and Mn2+ ions doped crystals. From the SEM micrograph analyses, it is observed that the doping of these metal ions modify the surface morphology of the grown crystals.
Journal: Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy - Volume 76, Issue 5, 1 September 2010, Pages 470–475