کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1237740 | 968906 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Effect of swift heavy ions in Ni-Al nanocrystalline films studied by X-ray absorption spectroscopy
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موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی آنالیزی یا شیمی تجزیه
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چکیده انگلیسی
X-ray absorption spectroscopic measurements have been used to compare the electronic structures of swift heavy ions (100Â MeV Si ions) irradiated and pristine Ni-Al nanocrystalline films. Results from X-ray diffraction (XRD), X-ray absorption near-edge structure (XANES) spectra at Al K-, and Ni L2,3-edges and extended X-ray absorption fine structure (EXAFS) at Ni K-edges are discussed. The observed XRD peaks indicate the improvement of crystalline nature and Al(1Â 1Â 1) clustering after the swift heavy ion interactions. While the XANES spectra at Ni L2,3-edges show decrease in the intensity of white line strength, the Al K-edge shows increase in intensity after irradiation. Above results imply that swift heavy ions induce low Z (i.e., Al) ion mass transport, changes in Al sp-Ni-d hybridization, and charge transfer. EXAFS results show that crystalline nature is improved after swift heavy irradiation which is consistent with XRD results.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy - Volume 70, Issue 2, July 2008, Pages 454-457
Journal: Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy - Volume 70, Issue 2, July 2008, Pages 454-457
نویسندگان
K. Asokan, H.M. Tsai, C.W. Bao, J.W. Chiou, W.F. Pong, G. Sonia, T.J.S. Anand,