Impact of electrical measurement parameters on the hysteresis behavior of pentacene-based organic thin-film transistors

In this paper the influence of measurement parameters such as the duration of the measurement and the time between successive measurement points on the hysteresis behavior of pentacene organic thin-film transistors is investigated. It is shown that electrical measurement parameters influence the width and even the direction of the hysteresis in the I–V characteristics. We present that this can be explained by a theory based on bulk traps in the pentacene layer. The theory is proven by measurements and device simulations.