کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1288065 | 1645393 | 2013 | 8 صفحه PDF | دانلود رایگان |
ZnO doping can significantly diminish the deleterious effect caused by impurities on the grain-boundary conduction of polycrystalline Ce0.8Gd0.2O1.9 electrolyte. Analysis by field emission transmission electron microscopy equipped with energy-dispersive X-ray spectroscopy reveals that the siliceous and ZnO phases are separately aggregated at the triple grain junction areas in ZnO-added specimens. This finding implies that the scavenging process does not occur via the expected formation of zinc silicates, but via a novel mechanism in which resistive siliceous phases strongly aggregate in non-wetting configurations induced by ZnO. A three-dimensional schematic is established to elucidate the role of ZnO in the CeO2–Gd2O3 system.
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► ZnO doping can diminish the deleterious effect caused by impurities on GDC.
► TEM-EDS analysis reveals a novel scavenging mechanism.
► A 3D schematic is established to elucidate the role of ZnO in the CeO2–Gd2O3 system.
Journal: Journal of Power Sources - Volume 230, 15 May 2013, Pages 161–168