The interface effect on the I-V curves and analysis of ionic diffusion coefficients of polycrystalline CuIn4Te6

► It has been found that a CuIn4Te6 polycrystal is a MIEC. ► The potential decay method is used to measure the electrical properties. ► Hysteresis effects have been observed in the I-V relations. ► An equivalent electrical circuit has been used to explain the results. ► The role of an interface residual voltage due to previous measurements is discussed.