کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1296545 1498342 2010 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
High resolution electrical characterisation of Ag-conducting heterogeneous chalcogenide glasses
موضوعات مرتبط
مهندسی و علوم پایه شیمی الکتروشیمی
پیش نمایش صفحه اول مقاله
High resolution electrical characterisation of Ag-conducting heterogeneous chalcogenide glasses
چکیده انگلیسی

Electric force microscopy (EFM) and conductive atomic force microcopy (C-AFM) are introduced to perform nanoscale electrical characterization of phase separated Agx(Ge0.25Se0.75)100 − x glasses. Changes in the relative permittivity are found for both phases when the silver content is changed. Furthermore, the sensitivity of the C-AFM technique revealed current variations of a few pico-amperes in the Ag-rich phase for the different glass compositions. This result confirms that the increase in conductivity of the Ag–Ge–Se samples in the region of high ionic conduction (x > 8–10 at.%) arises from an increase in conductivity of the Ag-rich phase and not from an increase in amount of Ag-rich phase with a fixed composition and conductivity.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solid State Ionics - Volume 181, Issues 25–26, 26 August 2010, Pages 1205–1208
نویسندگان
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