کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1296564 | 1498337 | 2010 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
الکتروشیمی
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چکیده انگلیسی
Platinum/yttria stabilized zirconia (Pt/YSZ) interfaces with two different orientation relationships were characterized using advanced analytical transmission electron microscopy methods. Quantitative X-ray energy dispersive spectroscopy (XEDS) was performed by the recently developed ζ-factor method. Neither interdiffusion nor segregation was detected across the Pt/YSZ interfaces of both orientation conditions within the resolution limit of the technique. The interface specific components of the electron energy-loss near-edge structures (ELNES) were extracted by employing the spatial difference technique. Features of the O-K ELNES at the interface are distinctly different from that at bulk YSZ indicating Pt-O bonding. The experimentally observed changes in the O-K ELNES are in good agreement with the results of ab-initio full multiple scattering calculation, based on structure modeling at the interfaces.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solid State Ionics - Volume 181, Issues 35â36, 9 November 2010, Pages 1616-1622
Journal: Solid State Ionics - Volume 181, Issues 35â36, 9 November 2010, Pages 1616-1622
نویسندگان
V. Srot, M. Watanabe, C. Scheu, P.A. van Aken, U. Salzberger, B. LuerÃen, J. Janek, M. Rühle,