کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1462487 989633 2012 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Phase evolution and microwave dielectric properties of MgO–B2O3–SiO2–based glass–ceramics
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Phase evolution and microwave dielectric properties of MgO–B2O3–SiO2–based glass–ceramics
چکیده انگلیسی

The densification and crystallization behaviors of MgO–B2O3–SiO2 (MBS) glass with various amounts of TiO2 additions (0–10 wt.%) were investigated by means of thermal analysis, X-ray powder diffraction and scanning electron microscopy. A microwave dielectric characterization was performed in order to evaluate the suitability of MBS glass–ceramics as a low-permittivity dielectric substrate. The densification of the MBS glass started below 700 °C. The main crystalline phases of Mg2B2O5 and MgSiO3 appeared at 800 and 950 °C, respectively. The Mg3TiB2O8 and TiB0.024O2 phases additionally crystallized in TiO2-added MBS glass–ceramics at 1000 °C. The permittivity increased from 6.1 in pure MBS glass to 6.9 in MBS glass with 10 wt.% of TiO2. The addition of TiO2 enhanced the crystallization and consequently increased the Qxf-values of the MBS glass (11 300 GHz) up to 16 500 GHz. The improvement of the Qxf-values became the most evident at 1050 °C. Dense MBS glass–ceramics sintered at 850 ≤ T ≤ 950 °C exhibited Qxf-values of 5000–8000 GHz (at ∼12 GHz), which are comparable with the values of CaO–B2O3–SiO2-based glass–ceramics.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ceramics International - Volume 38, Issue 2, March 2012, Pages 1019–1025
نویسندگان
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