کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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1462658 | 989636 | 2012 | 9 صفحه PDF | دانلود رایگان |
Bi0.85La0.15FeO3 (BLFO015) thin films were deposited by the polymeric precursor solution on La0.5Sr0.5CoO3 substrates. For comparison, the films were also deposited on Pt bottom electrode. X-ray diffraction data confirmed the substitutions of La into the Bi site with the elimination of all secondary phases under a substitution ratio x = 15% at a temperature of 500 °C for 2 h. A substantial increase in the remnant polarization (Pr) with La0.5Sr0.5CoO3 bottom electrode (Pr ≈ 34 μC/cm2) after a drive voltage of 9 V was observed when compared with the same film deposited on Pt substrate. The leakage current behavior at room temperature decreased from 10−8 (Pt) to 10−10 A/cm2 on (La0.5Sr0.5CoO3) electrode under a voltage of 5 V. The fatigue resistance of the Au/BLFO015/LSCO/Pt/TiO2/SiO2/Si (1 0 0) capacitors with a thickness of 280 nm exhibited no degradation after 1 × 108 switching cycles at a frequency of 1 MHz.
Journal: Ceramics International - Volume 38, Issue 5, July 2012, Pages 3841–3849