کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1475906 | 991134 | 2010 | 4 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy](/preview/png/1475906.png)
The conductivity of ZnO–varistor ceramics has been analyzed with conductive atomic force microscopy (C-AFM) under atmospheric conditions by measuring the current at different voltages and positions in zinc oxide-based multilayer varistors (MLVs). It is possible to detect individual ZnO grains on the polished sample surface in the AFM topography mode as well as in the two-dimensional current images. Additionally local current–voltage (IV) curves revealed details of the electrical behaviour of the material. To correlate the laterally resolved current image with grain orientations, electron backscattering diffraction (EBSD) has been performed. Beside the well-known varistor behaviour specific influence of the local microstructure has been found.
Journal: Journal of the European Ceramic Society - Volume 30, Issue 7, May 2010, Pages 1761–1764