Dynamic behavior of nanometer-scale amorphous intergranular film in silicon nitride by in situ high-resolution transmission electron microscopy

We report about the dynamic behavior of a nanometer-scale amorphous intergranular film (IGF) in a Si3N4 ceramic by an in situ heating experiment in a high-resolution transmission electron microscopy (HRTEM). During the experiment the IGF gradually vanishes at 820 °C accompanied by the formation of crystal planes within the IGF. The IGF reappears after cooling back to room temperature. The results cannot be explained within the framework of a force balance model. We argue that the dynamic behavior of the IGF in our experiment originates from the open system observed.