کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1476672 | 1510147 | 2007 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Measurements of the surface resistance and conductivity of thin conductive films at frequency about 1Â GHz employing dielectric resonator technique
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Measurements of the surface resistance and conductivity of thin conductive films at frequency about 1Â GHz employing dielectric resonator technique Measurements of the surface resistance and conductivity of thin conductive films at frequency about 1Â GHz employing dielectric resonator technique](/preview/png/1476672.png)
چکیده انگلیسی
A dielectric resonator technique has been developed for measurements of conductivity and surface resistance of thin metal films deposited on a dielectric substrate. This technique allows for measurements of films having surface resistances that are smaller than 5 Ω without requiring the need to perform measurements of the substrate thickness. The uncertainty of the surface resistance measurements is about 2-3% for both thin films and bulk materials. The accuracy of the conductivity measurements of the thin films is similar to the accuracy of the measurements of their thickness. Several samples have been measured having thicknesses that range from 66 nm to 50 μm.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of the European Ceramic Society - Volume 27, Issues 8â9, 2007, Pages 2823-2826
Journal: Journal of the European Ceramic Society - Volume 27, Issues 8â9, 2007, Pages 2823-2826
نویسندگان
Jerzy Krupka, Krzysztof Derzakowski, Tomasz Zychowicz, Bradley L. Givot, William C. Egbert, M.M. David,