Electronic mechanism of thermal destruction of radiation-induced E'-centers in crystalline and glassy SiO2

The thermal decay regularities for radiation-induced E'-centers in crystalline and glassy SiO2 were investigated. The results obtained point out that the destruction of E'-centers can be described as ionization process of deep centers in electric field. In terms of used model, the electric field and electron–vibration coupling parameters are sensitive to structural disorder. The most weak electron–phonon coupling in E'-centers is observed for amorphous systems.

Research Highlights
► The thermal decay of radiation-induced E'-centers in SiO2 is investigated.
► E'-centers destruction is described as ionization of deep centers in electric field.
► The electric field and electron–vibration coupling are sensitive to structural disorder.
► The most weak electron–phonon coupling in E'-center is observed for amorphous systems.