کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1486698 | 1510563 | 2005 | 5 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Persistent microscopic charge patterns in amorphous silicon thin films for guided assembly of colloids Persistent microscopic charge patterns in amorphous silicon thin films for guided assembly of colloids](/preview/png/1486698.png)
Persistent microscopic charge patterns are written on hydrogenated amorphous silicon thin films (a-Si:H) using ambient atomic force microscopy (AFM). The stored charge is characterized as a function of time by Kelvin force microscopy. Negatively charged patterns are prepared using positive voltage pulses on AFM tips. The resulting surface potential difference as high as 0.8 V is not influenced by exposure to pure water. Using negative tip voltages positively charged patterns are grown on the a-Si:H surfaces via anodic oxidation. After exposure to water the positive potential contrast is enhanced by >100%. The origin of potential contrast before and after water exposure is discussed. This technology can open interesting prospects for hybrid organic-silicon devices.
Journal: Journal of Non-Crystalline Solids - Volume 351, Issues 37–39, 1 October 2005, Pages 3127–3131