Keywords: 68.37.P; 07.79.Lh; 62.25.Jk; 68.37.Ps; Atomic force microscope; Sensitivity analysis; A modified couple stress theory;
مقالات ISI 68.37.P (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
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Keywords: 68.37.P; 68.37.Ps; 07.79.Lh; 62.25.+g; Atomic force microscopy; Synchronous detection; Higher-harmonics imaging; Phase imaging; Material contrast;
Keywords: 68.37.P; 68.37.Ps; 07.79.Lh; 81.70.Pg; 06.20.fbSThM, scanning thermal microscopy; P-SThM, passive-mode scanning thermal microscopy; A-SThM, active-mode scanning thermal microscopy; AFM, atomic force microscopy; μTA, microthermal analysis; ITS-90, the International
Keywords: 68.37.P; 68.37.Ps; 68.55.âa; 78.68.+m; Wettability; Ag thin films; Substrate material; Surface morphologies; Optical properties;
Keywords: 68.37.P; 81.05.Cy; 81.65.Cf; 68.37.Ps; 68.35.Ct; Semiconductors; Etching; Scaling analysis;
Nano-Newton force based pseudoferroelectric Al-doped ZnO/Si switchable diode
Keywords: 68.37.P; 81.15.Cd; 73.61.Wp; 73.50.Pz; 68.37.Ps; Kelvin probe force microscopy; Conductive atomic force microscopy; Transparent conductive oxide;
Exploration of thermal stability of Ag(Al) films in air by evolutions of surface morphology and optic-electric properties
Keywords: 68.37.P; Ag(Al) films; Co-evaporation; Annealing in air; Retardation; Agglomeration; 68.60.Dv; 68.37.Ps; 68.55.âa; 78.68.+m;
Lamellar versus compact self-assembly of lipoguanosine derivatives in thin surface films
Keywords: 68.37.P; 68.18.−g; 68.47.Pe; 68.37.Ps; 81.16.Dn; 81.16.Fg; 87.14.G−; 87.15.−vGuanosine derivatives; Surface-assembly; Langmuir films; Langmuir–Blodgett films; Atomic force microscopy
Electronic properties of a single heterojunction in InSb/InAs quantum dot system
Keywords: 68.37.P; 68.37.Ps; 81.07.Ta; 81.15.Lm; 81.15.Gh; 81.16.Dn; LPE; Quantum dots; Heterostructures; III-V semiconductors; AFM; I-V characteristics;
Subsurface measurement of nanostructures on GaAs by electrostatic force microscopy
Keywords: 68.37.P; 73.20.At; 61.05.-a; 68.37.-d; 68.37.Ps; 68.43.-h; 68.47.Fg; 61.46.Df; Scanning probe microscopy; Electro static force microscopy; III-V semiconductor; Surface oxide;
Improvement of the power conversion efficiency of organic photovoltaic cells with a P3HT layer fabricated by using a sonication process and having a vertically modulated nanoscale morphology
Keywords: 68.37.P; 84.60.Jt; 73.50.Pz; 68.37.Ps; 82.80; Organic photovoltaic cells; P3HT; Rough structures; Power conversion efficiency; Nanoscale morphology;
Adsorption of silver on glucose studied with MIES, UPS, XPS and AFM
Keywords: 68.37.P; 68.37.Ps; 81.15.Dj; 82.45.Mp; 82.80.Pv; Silver; Glucose; Valence band; Metastable induced electron spectroscopy; Ultraviolet photoelectron spectroscopy; X-ray photoelectron spectroscopy; Atomic force microscopy; Reduction;
Liponucleoside thin films: The special behaviour of guanosine
Keywords: 68.37.P; 68.18.−g; 87.14.G−; 68.37.Ps; 81.16.Fg; 81.16.Dn; 87.15.−vNucleolipids; Surface-assembly; Langmuir films; Langmuir–Blodgett films
Study of thermally evaporated thin permalloy films by the Fresnel mode of TEM and AFM
Keywords: 68.37.P; 75.60.Ch; 68.55.Jk; 68.37.Ps; 68.37.LpThin permalloy films; Magnetic domain structure; Morphological structure; Transmission electron microscopy; Atomic force microscopy
Optoelectronic and thermoelectric properties in Ga doped β- PbS2 nanostructured thin films
Keywords: 68.37.P; 73.50.Lw; 61.05.cp; 68.37.Hk; 68.37.Ps; Thin films; X-ray photoelectron spectroscopy; X-ray diffraction; Optical properties; Thermopower;
Laser-fluence effects on NbNx thin films fabricated by pulsed laser deposition
Keywords: 68.37.P; 74.70.Ad; 74.78.Db; 74.62.Bf; 79.20.Eb; 61.05.cp; 68.37.Ps; 68.55.âa; Niobium nitride; Pulsed laser deposition; Thin films; Surface morphology; Laser fluence;
Scanning surface potential microscopy of spore adhesion on surfaces
Keywords: 68.37.P; 07.79.Lh; 68.37.Ps; 87.17.Pq; 87.17.RtAtomic force microscopy; Scanning surface potential microscopy; SSPM; Kelvin probe force microscopy; KPFM; Spore adhesion; Spores
Thermal stability of magnetron sputtered amorphous Si2C
Keywords: 68.37.P; 61.43.Dq; 68.55.ag; 68.37.Ps; 82.80.Pv; 68.37.Hk; Silicon carbide; Amorphous films; Crystallization; Sputter-deposition;
Force-feedback high-speed atomic force microscope for studying large biological systems
Keywords: 68.37.P; HSAFM; high-speed atomic force microscopy; COIFM; cantilever-based optical interfacial microscope; DMASP; dimensional micro-actuated silicon probe; 68.35.âp; 68.37.âd; 68.37.Ps; 68.47.âb; COIFM; Force-feedback; High-speed AFM; Interfacial force micr
Thermodynamic evolution of antiphase boundaries in GaP/Si epilayers evidenced by advanced X-ray scattering
Keywords: 68.37.P; 68.55.ag; 61.72.Dd; 68.37.Ps; 78.70.Ck; X-ray scattering; Growth models; Planar defects; Molecular beam epitaxy; Migration enhanced epitaxy; Semi-conducting III-V materials;
Structural, optical and hydrophilic properties of nanocrystalline TiO2 ultra-thin films prepared by pulsed dc reactive magnetron sputtering
Keywords: 68.37.P; 61.05.cp; 68.37.Ps; 81.15.Cd; 82.30.RsOptical properties; Photo-induced hydrophilic; Sputtering; Thin films; Titanium dioxide
Effects of substrate temperature on properties of NbNx films grown on Nb by pulsed laser deposition
Keywords: 68.37.P; 74.70.Ad; 74.78.Db; 74.62.Bf; 79.20.Eb; 61.05.cp; 68.37.Ps; 68.55.-a; NbNx; Pulsed laser deposition; Thin films; Surface morphology;
Realization of stable p-type ZnO thin films using Li–N dual acceptors
Keywords: 68.37.P; 68.37.Ps; 68.55.J; 73.61.Ga; 78.20.Cip-ZnO; Structural properties; Strain; Electrical resistivity; Optical properties
Structural and optical properties of ZnO thin films prepared by sol-gel method with different thickness
Keywords: 68.37.P; 61.05.cp; 68.37.Ps; 68.55.âa; 78.55.Et; ZnO thin films; Film thickness; Sol-gel method; Growth mode; Optical properties;
Microstructural changes induced by low energy heavy ion irradiation in titanium silicon carbide
Keywords: 68.37.P; 81.05.Je; 61.80.Lj; 25.75.Ag; 28.41.Bm; 68.37.Ps; 61.05.J−Ti3SiC2; Nuclear interaction; Electron back-scatter diffraction; Atomic force microscopy; Anisotropic swelling
Influence of hydrogen annealing on the properties of hafnium oxide thin films
Keywords: 68.37.P; 68.37.Ps; 81.05.Gc; 81.15.Fg; 81.40.Tv; 81.70.JbHafnium oxide; e-Beam evaporation; Hydrogen annealing; Structural properties; Chemical properties; Optical properties; Electrical properties
Plasma modification of self-assembled structures of CoTMPP molecules
Keywords: 68.37.P; 52.40.Hf; 68.37.Ps; 68.55.Jâ; Plasma treatment; Porphyrin; Catalysts; Self-assembly; Atomic force microscopy;
Stability of hydrogen-terminated vicinal Si(1 1 1) surface under ambient atmosphere
Keywords: 68.37.P; 81.65.Cf; 81.65.Rv; 68.37.Ps; 68.47.Fg; 79.60.âi; Silicon substrates; Wet-chemical pre-treatment; Etching; Oxidation; X-ray photoelectron spectroscopy;
Tribological and magnetic characterization of fluorosilanes on cobalt surface
Keywords: 68.37.P; 81.40.Pq; 68.35.Np; 68.37.Ps; 75.60.Ch; 68.37.Rt; Fluorosilanes; Cobalt film; Nanotribology; Atomic force microscopy; Magnetic domain structure; Magnetic force microscopy;
Surface modification of doped ZnO thin films
Keywords: 68.37.P; 68.55 jm; 68.37.Ps; 78.66.Hf; 81.15.Cd; Thin-film solar cell; ZnO:Al; Sputtering;
Structural studies of ZnS thin films grown on GaAs by RF magnetron sputtering
Keywords: 68.37.P; 61.46.-w; 68.37.Ps; 68.55.-aSputtering; Nanoparticles; ZnS; XRD; AFM
Formation of two-dimensional InAs quantum dot arrays by self-organized anisotropic strain engineering on InP (3 1 1)B substrates
Keywords: 68.37.P; 81.07.Ta; 81.15.Hi; 81.16.Dn; 68.65.Cd; 68.37.Ps; 78.67.HcA1. Low-dimensional structures; A3. Chemical-beam epitaxy; B1. Nanomaterials
Effect of aging time of ZnO sol on the structural and optical properties of ZnO thin films prepared by sol-gel method
Keywords: 68.37.P; 61.10.Nz; 68.37.Ps; 68.55.âa; 73.61.Ga; 74.25.Gz; ZnO thin films; Sol-gel method; Aging time; Transmittance; Photoluminescence;
Influence of rapid thermal annealing on electrical and structural properties of double metal structure Au/Ni/n-InP (1 1 1) diodes
Keywords: 68.37.P; 61.05.cp; 68.37.Ps; 73.30.+y; 73.40.Kp; 85.30.Hi; 85.30.KkIndium phosphide; Ni/Au Schottky contacts; Electrical and structural properties; Auger electron spectroscopy; X-ray diffraction; Surface morphology
Replication of butterfly wing microstructures using molding lithography
Keywords: 68.37.P; 68.35.-p; 68.37.Ps; 78.55.-m; 78.68.+mBionics; Butterfly wing; Iridescent effect; Fluorescence; Molding
On the influence of the surface roughness onto the ultrathin SiO2/Si structure properties
Keywords: 68.37.P; 68.35.bg; 68.35.Ct; 68.37.Ef; 68.37.Ps; Semiconductor; Thin film; Surface roughness; Fractal methods; Atomic force microscopy (AFM); Scanning tunneling microscopy (STM);
Wet sulfur passivation of GaSb(1Â 0Â 0) surface for optoelectronic applications
Keywords: 68.37.P; 81.05.Ea; 81.65.Rv; 81.65.Cf; 78.55.Cr; 68.37.Ps; 73.40.Kp; GaSb; Passivation; Annealing; Photoluminescence; AFM; LPE; MBE;
Epitaxial growth of highly transparent and conducting Sc-doped ZnO films on c-plane sapphire by sol-gel process without buffer
Keywords: 68.37.P; 81.05.Dz; 61.05.cp; 61.05.jh; 68.37.Hk; 68.37.Ps; 81.15.Kk; Zinc oxide; Scandium doping; Sol-gel; Thin films; Annealing temperature;
Surface defects characterization with frequency and force modulation atomic force microscopy using molecular dynamics simulations
Keywords: 68.37.P; 07.79.Lh; 68.37.Ps; 02.70.Ns; 31.15.xvMolecular dynamics simulation; Frequency and force modulation AFM; System parameters effects on topography; Optimum control scheme
Dependence of surface nano-structural modifications of Ti implanted by N+ ions on temperature
Keywords: 68.37.P; 68.55.Ln; 68.49.Sf; 82.80.Ms; 68.37.Ps; SEM; AFM; XRD; SIMS; Ion implantation; Depth profile; Ion implantation;
Epitaxial growth of improved GaN epilayer on sapphire substrate with platinum nanocluster
Keywords: 68.37.P; 61.05.cp; 68.37.Ps; 78.55.Cr; 81.15.GhA1. High-resolution X-ray diffraction; A1. Photoluminescence; A3. Metalorganic chemical vapor deposition; B1. Nitrides
Towards spectroscopy of a few silicon nanocrystals embedded in silica
Keywords: 68.37.P; 78.55.Ap; 61.46.Hk; 68.37.Ps; 81.07.Bc; 81.16.Nd; Silicon nanocrystals; Lithography; Photoluminescence spectroscopy; Single object analysis;
Ionic charge-selective electron transfer on self-assembled polyelectrolyte-modified ITO electrode
Keywords: 68.37.P; 68.37.Ps; 68.37.Hk; 81.16.Dn; 68.55.−a; 63.22.NpPolyelectrolyte multilayer; Self-assembly; Charge selectivity; Surface morphology; Redox reaction
SDTrimSP-2D studies of the influence of mutual flux arrangement on erosion and deposition
Keywords: 68.37.P; 61.80.Jh; 68.03.Hj; 68.37.Hk; 68.37.Ps
Distinct growth phenomenon observed on l-Arg · CF3COOH crystals
Keywords: 68.37.P; 68.37.Ps; 42.70.MpOptical materials; Atomic force microscopy; Defects
Evolution of ion-induced ripple patterns on SiO2 surfaces
Keywords: 68.37.P; 68.37.Ps; 79.20.Rf; 81.16.Rf; 81.65.CfNanopatterning; Ion sputtering; Amorphization; AFM
Selective nanoshaving of self-assembled monolayers of 2-(4-pyridylethyl)triethoxysilane
Keywords: 68.37.P; 71.20.Rv; 73.20.At; 73.63.Rt; 68.37.Ps; 81.07.-bNanoshaving; Self-assembled monolayers; 2-(4-Pyridylethyl)triethoxysilane; Atomic force microscope; Electronic structure of organic layers
Enhanced susceptibility of CaF2(1 1 1) to adsorption due to ion irradiation
Keywords: 68.37.P; 68.37.Ps; 61.80.Jh; 68.43.HnSurface modifications; Ion irradiation; Atomic force microscopy; CaF2
Evolution of composition distribution of Si-capped Ge islands on Si(001)
Keywords: 68.37.P; 68.65Hb; 68.65.Ac; 68.37.Ps; 61.72.FfSiGe; Self-assembled; Quantum dot; Island; UHV/CVD
High-speed atomic force microscope lithography using a piezo tube scanner driven by a sinusoidal waveform
Keywords: 68.37.P; 07.79.Lh; 68.37.Ps; 06.60.Jn; 81.07.−b; 61.46.−w; 43.40.Vn; 45.80.+jAFM lithography; Nanolithography; Sinusoidal waveform signal; Organic resists; Photo acid generator