کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1547442 997635 2009 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Towards spectroscopy of a few silicon nanocrystals embedded in silica
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
Towards spectroscopy of a few silicon nanocrystals embedded in silica
چکیده انگلیسی
This work aims at optical isolation of a few silicon nanocrystals (Si-NCs) embedded in silica. We rely on realization of a SiO single layer followed by annealing under vacuum to generate Si-NCs. We first report on optimization of luminescence of single Si-NC layer in SiO2 thin film. An optimum of photoluminescence signal was found for annealing at 1050 °C for 95 min. Then, in order to optically isolate single Si-NCs, lithographic processes such as creation of aluminum masks have been employed. We discuss the challenges and the chances of measuring a photoluminescence signal from few Si-NCs.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica E: Low-dimensional Systems and Nanostructures - Volume 41, Issue 6, May 2009, Pages 998-1001
نویسندگان
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