Copper tin sulfide (CuxSnSy) thin films evaporated with x = 3,4 atomic ratios: Influence of the substrate temperature and the subsequent annealing in sulfur

Copper tin sulfide (CuxSnSy) thin films evaporated with x = 3,4 atomic ratios: Influence of the substrate temperature and the subsequent annealing in sulfur

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Research Bulletin - Volume 83, November 2016, Pages 116-121

V. Robles, J.F. Trigo, C. Guillén, J. Herrero,