کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1487766 1510707 2015 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Characterization of novel BaZnSnO thin films by solution process and applications in thin film transistors
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Characterization of novel BaZnSnO thin films by solution process and applications in thin film transistors
چکیده انگلیسی


• No reports about BaZnSnO thin film using solution process.
• BaZnSnO thin film transistor (TFT) was firstly fabricated.
• BaZnSnO-TFT shows a acceptable performace.
• Influence of Ba content on BaZnSnO-TFT.

A novel BaZnSnO semiconductor is fabricated using solution process and the influence of Ba addition on the structure, the chemical state of oxygen and electrical performance of BaZnSnO thin films are investigated. A high performance BaZnSnO-based thin film transistor with 15 mol% Ba is obtained, showing a saturation mobility of 1.94 cm2/V s, a threshold voltage of 3.6 V, an on/off current ratio of 6.2 × 106, a subthreshold swing of 0.94 V/decade, and a good bias stability. Transistors with solution processed BaZnSnO films are promising candidates for the development of future large-area, low-cost and high-performance electronic devices.

This work reports the Ba content on thin film transistor based on a novel BaZnSnO semiconductor using solution process.Figure optionsDownload as PowerPoint slide

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Research Bulletin - Volume 68, August 2015, Pages 22–26
نویسندگان
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