کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1489771 992312 2012 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Solution-deposited GdCeOx thin films: Microstructure, band structure, and dielectric property
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Solution-deposited GdCeOx thin films: Microstructure, band structure, and dielectric property
چکیده انگلیسی

The microstructural and electrical properties of solution-deposited GdCeOx dielectric thin films with different mixing ratios were studied. The Ce incorporation enhanced the degree of crystallization and the refractive index of the Gd2O3 film, reduced the hysteresis and increased the dielectric constant. According to reflective electron energy loss spectroscopy and X-ray photoelectron spectroscopy analyses, the bandgap of the GdCeOx film gradually decreased with increasing Ce/(Gd + Ce) atomic ratio, which was primarily affected by the reduction of the valence band offset.

Figure optionsDownload as PowerPoint slideHighlights
► Microstructural and electrical properties of sol–gel-deposited GdCeOx thin films with different mixing ratios.
► Ce incorporation enhanced crystallization and refractive index, reduced hysteresis, and increased dielectric constant.
► Bandgap gradually decreased with increasing Ce, which was primarily affected by VBO reduction.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Research Bulletin - Volume 47, Issue 6, June 2012, Pages 1423–1427
نویسندگان
, , , ,