کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1490131 992318 2012 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Low-temperature (210 °C) deposition of crystalline germanium via in situ disproportionation of GeI2
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Low-temperature (210 °C) deposition of crystalline germanium via in situ disproportionation of GeI2
چکیده انگلیسی

A new approach is reported for depositing crystalline germanium films. The deposition occurs at low temperatures (210–260 °C) via in situ disproportionation of GeI2 and is thereby useful for depositing Ge onto a wide range of surfaces. Deposition onto glass and polymer substrates is demonstrated. The rate of deposition onto glass is found to be 25 ng min−1. New synthetic routes to GeI2, GeI4, and Cu3Ge are also reported. These are valuable precursors for the synthesis of germanium nanostructures and organo-germanium compounds.

Formation of GeI2 from Ge and CuI at 400 °C followed by disproportionation at 210 °C deposits polycrystalline Ge. Deposition of GeI2 and GeI4 occurs in the regions below 210 °C.Figure optionsDownload as PowerPoint slideHighlights
► Germanium deposition at temperatures as low as 210 °C.
► Deposition proceeds via in situ disproportionation of GeI2.
► Glass and polymer substrates were successfully coated.
► The deposition rate is 25 ng min−1.
► This approach utilizes simple glass apparatus.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Research Bulletin - Volume 47, Issue 11, November 2012, Pages 3484–3488
نویسندگان
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