Thickness dependent transport and magnetotransport in CSD grown La0.7Pb0.3MnO3 manganite films

We report the effect of film thickness on transport and magnetotransport in La0.7Pb0.3MnO3 (LPMO) manganite films grown on single crystalline LaAlO3 substrate using chemical solution deposition (CSD) technique. AFM measurements show the island type grain growth responsible for the strain at the film–substrate interface, while structural studies using XRD shows the presence of thickness dependent compressive strain in the films which modifies the transport and magnetotransport in LPMO/LAO films. The observation of low temperature resistivity minima behavior in all the LPMO films has been explained in the context of electron–electron scattering mechanism. The ZFC–FC magnetization measurements show the glassy state behavior below Tmin.

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► Thickness dependent transport and MR of CSD grown La0.7Pb0.3MnO3 manganite films.
► Chemical Solution Deposition (CSD) is the low cost, simple and easy to handle.
► Prominent strain effect in lower thickness films.
► 3D lattice strain and microstructure govern the transport and MR in the films.
► Low temperature resistivity minima is also affected by 3D lattice strain.