کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1493495 1510780 2016 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Combined theoretical studies of the optical characteristics of II-IV-V2 semiconductor thin films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Combined theoretical studies of the optical characteristics of II-IV-V2 semiconductor thin films
چکیده انگلیسی


• Numerical analysis for optical spectra of some chalcopyrite thin films is presented.
• Absorbance spectra are recorded at normal incidence of light.
• MgGeAs2 shows a considerably high optical absorption.
• A thickness of 3.2 μm is sufficient to absorb 90% of the incident light.

The optical absorbance of four ternary thin films, i.e. MgSiP2, MgGeP2, MgSiAs2, MgGeAs2 have been theoretically examined over a wide range of wavelength from 300 nm to 800 nm. The combination of first-principle electronic structure calculations and the optical matrix approach for modeling the multilayer assembly have been employed for theoretical studies. The analysis of the calculated absorbance spectra at room temperature with unpolarized light and normal incidence, revealed that MgGeAs2 with a direct energy band gap of 1.6 eV exhibit a considerable high optical absorption, where a thickness of 3.2 μm of this thin film is sufficient to absorb 90% of the incident light and generates a maximum photocurrent of ∼23 mA/cm2.

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ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optical Materials - Volume 54, April 2016, Pages 200–206
نویسندگان
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