Temperature measurement based on photoluminescence of Er3+ doped Sr0.3Cd0.7F2 microcrystal coupled to scanning thermal microscopy

• We studied the calibration of a sensor for measuring local temperatures.
• A luminescent fluoride microcrystal is fixed on a thermal-resistive probe apex.
• We model the thermal behavior of each part (microcrystal and thermal probe).
• We correlate the temperature of the apex probe and the microcrystal temperature.
• The coupling of SThM with the probe fluorescence reveals a microsystem temperature rise.

Rare earth doped sub-micrometric luminescent materials are promising candidates for temperature sensing and play an efficient role in many technological fields. In this paper, a new optical sensor is developed for measuring local temperatures. This sensor is based on a thermal-resistive probe and on photoluminescence of a luminescent fluoride microcrystal. The final purpose is to develop a device calibrated in temperature and capable of acquiring images of local temperature at sub-micrometric scale. Indeed, the sensor temperature can be obtained in two distinct ways: one from the thermal probe parameters and the other from the green photoluminescence generated in the anti-Stokes mode by the active Er ions directly excited by a red laser. The thermal probe is based on Wollaston wire whose thermal-resistive element is in platinum/rhodium. Its temperature is estimated from the probe electrical characteristics and a modeling. A microcrystal of Sr0.3Cd0.7F2: Er3+(4%)–Yb3+(6%) of about 25 μm in diameter is glued at the probe extremity. This luminescent material has the particularity to give a green emission spectrum with intensities sensitive to small temperature variations. Using the fluorescence intensity ratio (FIR) technique, the crystal temperature is estimated from the intensity measurements at green wavelengths 522, 540 and 549 nm by taking advantage of particular optical properties due to the crystalline nature of Sr0.3Cd0.7F2: Er3+−Yb3+. The microcrystal temperature is then assessed as a function of electric current in the thermal probe by applying the Boltzmann’s equations. The coupling of the scanning thermal microscope (SThM) with the photoluminescence probe reveals that the particle fluorescence signal is affected by the temperature rise of an electrical microsystem submitted to a Joule heating. The first results are presented and discussed.