کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1496772 | 1510799 | 2006 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Depth-resolved nanostructure and refractive index of borosilicate glass doped with Ag nanocrystals
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
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چکیده انگلیسی
We present an investigation of the Ag-nanocrystal depth profile as well as the corresponding refractive index depth profile of borosilicate glass that was first doped with Ag by Na+ â Ag+ ion exchange and subsequently irradiated with 1 MeV Xe ions. By combining RBS, XPS, XE-AES, and transmission and reflection spectroscopy, we show unambiguously that the Ag nanocrystals are formed in a layer with a thickness (90 ± 20 nm) that is significantly smaller than the 1-MeV Xe range (340 nm). The effective refractive index for the highest Xe fluence is n = 2.1 + 0.8 i at the resonance wavelength (λ = 430 nm). The implications for the integration of surface-plasmon-resonance-based functionalities in photonic devices based on the described fabrication method are discussed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optical Materials - Volume 29, Issues 2â3, November 2006, Pages 326-331
Journal: Optical Materials - Volume 29, Issues 2â3, November 2006, Pages 326-331
نویسندگان
H. Mertens, A. Polman,