Quantification of strain and orientation measurement error in cross-correlation EBSD in hexagonal close-packed materials

Cross-correlation electron backscatter diffraction (CC-EBSD) is a novel technique for mapping relative elastic strain variations in the SEM. Recently Britton and Wilkinson have demonstrated that, in deformed materials, lattice rotations can result in non-physical strain values. In this work, we quantify this error for hcp polycrystals and demonstrate that similar artifacts can occur in the presence of large elastic strains. Additionally, open issues limiting the application of CC-EBSD to strain analysis in deformed polycrystals are highlighted.