Stress-driven grain growth in ultrafine grained Mg thin film

Significant grain growth, manifest as a doubling of the average grain size, was triggered during high rate Kolsky bar experiments on ultrafine grained Mg. This grain growth is attributed to the high applied stress and is consistent with recent reports of stress-driven grain boundary migration. The experimental results indicate that stress can trigger grain growth, thereby reducing the importance of thermal activation at very high stresses. This also indicates that stress-assisted grain growth is not restricted to small grained fcc metals.