Modulation reorientation in 10M Ni–Mn–Ga martensite

Synchrotron X-ray diffraction experiments were performed to investigate modulation reorientation by an external stress in a 10M Ni–Mn–Ga single crystal. The initial crystal, with a single c-axis, exhibited two modulation directions, indicating {1 0 0) compound twins. Due to monoclinic distortion of the pseudo-tetragonal lattice, a compression along 〈110] with constraint on the c-axis resulted in a single modulation along the stress axis, i.e. the elimination of {1 0 0) compound twins. Subsequent perpendicular compression reoriented the modulation towards the new loading axis.