کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1499279 | 993300 | 2013 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Asymmetric X-ray line broadening caused by dislocation polarization induced by external load
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Asymmetric X-ray line broadening caused by dislocation polarization induced by external load Asymmetric X-ray line broadening caused by dislocation polarization induced by external load](/preview/png/1499279.png)
چکیده انگلیسی
An external load, even if smaller than the flow stress, generates dislocation rearrangement leading to a net polarization of the system. According to the theory of X-ray line broadening, this polarization leads to Bragg peak asymmetry. Here we present an experimental validation of the theory by in situ profile measurements on “elastically” deformed Cu single crystals. The profiles are evaluated by the “restricted moments method”. In agreement with the theory it is found that peak asymmetry increases with deformation.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 68, Issue 9, May 2013, Pages 755–758
Journal: Scripta Materialia - Volume 68, Issue 9, May 2013, Pages 755–758
نویسندگان
I. Groma, D. Tüzes, P.D. Ispánovity,