In situ tomographic investigation of brass during high-temperature creep

Microstructure evolution during high-temperature creep of a CuZn40Pb2 brass alloy was characterized in situ by synchrotron microtomography. It is shown that tomographic data are sufficiently accurate for local material characterization. Imposing a constant temperature gradient along the gauge length of the sample allows the apparent activation energy of steady-state creep to be evaluated for a single specimen.