On the character of host–island grain interfaces in Fe–1%Si alloy

The character of the boundaries surrounding island grains embedded in abnormally growing grains in a Fe–1%Si alloy was investigated using electron backscatter diffraction and orientation imaging microscopy techniques. The grain boundary misorientation is the primary method used for this characterization. It was found that the island grains were most frequently misoriented by 55–60° about 〈1 1 1〉 directions from their respective host abnormally large grains. Host–island grain interfaces were predominantly of Σ3 character and low-angle grain boundaries, which have typically been associated with low mobility. It is reasonable to conclude that these boundaries were “left behind” by the faster growing abnormally large grains.