کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1505216 | 993755 | 2011 | 5 صفحه PDF | دانلود رایگان |

In glasses with the mol% composition 20 SiO2∙13.5 B2O3∙6 Al2O3 ∙ 10 PbO∙6.6 CdO 20 PbF2 13.3 CdF2∙10 YbF3∙0.5 ErF3∙, annealing at temperatures in the range from 405 to 450 °C leads to the formation of (Pb, Yb, Er)Fx crystals. The mean crystallite size as determined by XRD-line broadening remains constant when the annealing time is increased. With increasing annealing temperature, the quantity of crystals formed gets larger while the size of the crystals increases slightly. The glass transition temperature of partially crystallized samples increased with increasing annealing time and approaches a value equal to the temperature, the samples were annealed. This was explained by the formation of a highly viscous layer formed during crystallization. This layer is enriched in SiO2, acts as a diffusion barrier and hinders further crystal growth.
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Journal: Solid State Sciences - Volume 13, Issue 5, May 2011, Pages 1132–1136