Investigation of spatial and energetic trap distributions in 1 nm EOT SiO2/HfO2 by discharging-sweep mode amplitude charge pumping

Investigation of spatial and energetic trap distributions in 1 nm EOT SiO2/HfO2 by discharging-sweep mode amplitude charge pumping

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solid State Sciences - Volume 13, Issue 6, June 2011, Pages 1360-1363

Eun-Ae Chung, Kab-Jin Nam, Young-Pil Kim, Ji-Young Min, Moonju Cho, Hyungseok Hong, Jeong Han, Jae-Duk Lee, Yu-Gyun Shin, Siyoung Choi, Sangsig Kim,