کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1518484 | 1511630 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Elastic modulus of supercooled liquid and hot solid silicon measured by inelastic X-ray scattering
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Elastic modulus of supercooled liquid and hot solid silicon measured by inelastic X-ray scattering Elastic modulus of supercooled liquid and hot solid silicon measured by inelastic X-ray scattering](/preview/png/1518484.png)
چکیده انگلیسی
The dynamical structure factors of supercooled-liquid and hot-solid silicon are measured by inelastic X-ray scattering at the same temperature, 1620 K. Two significant changes in the averaged longitudinal sound velocities and in the longitudinal modulus are observed. First, we observe a different longitudinal modulus in the polycrystalline hot-solid silicon compared to the extrapolated value obtained from the single-crystal measurement. This reduction of the modulus may be a precursor of the semiconductor-to-metal transition. Second, the increase in the longitudinal modulus in the liquid upon supercooling is consistent with an increase in the degree of the directional bonding.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Physics and Chemistry of Solids - Volume 66, Issue 12, December 2005, Pages 2230–2234
Journal: Journal of Physics and Chemistry of Solids - Volume 66, Issue 12, December 2005, Pages 2230–2234
نویسندگان
A. Alatas, A.H. Said, H. Sinn, E.E. Alp, C.N. Kodituwakku, B. Reinhart, M.-L. Saboungi, D.L. Price,