Enhancement microwave dielectric properties of Mg2SnO4 ceramics by substituting Mg2+ with Ni2+

The microwave dielectric properties of (Mg(1−x)Nix)2SnO4 ceramics were examined with a view to their exploitation for mobile communication. The (Mg(1−x)Nix)2SnO4 ceramics were prepared by the conventional solid-state method with various sintering temperatures. The X-ray diffraction (XRD) patterns of the (Mg0.95Ni0.05)2SnO4 ceramics revealed no significant variation of phase with sintering temperatures. A maximum density of 4.77 g cm−3 was obtained for (Mg0.95Ni0.05)2SnO4 ceramic, sintered at 1550 °C for 4 h. Dielectric constant (ɛr) of 8.72, quality factor (Q × f) of 103,100 GHz, and temperature coefficient of resonant frequency (τf) of −62.8 ppm °C−1 were obtained for (Mg0.95Ni0.05)2SnO4 ceramics that were sintered at 1550 °C for 4 h.

► (Mg0.95Ni0.05)2SnO4 ceramics that were sintered at 1550 °C for 4 h had an apparent density of 4.77 g cm−3.
► (Mg0.95Ni0.05)2SnO4 ceramics that were sintered at 1550 °C for 4 h had a dielectric constant of 8.72.
► (Mg0.95Ni0.05)2SnO4 ceramics that were sintered at 1550 °C for 4 h had a Q × f of 103,100 GHz.
► The dielectric constant of (Mg(1−x)Nix)2SnO4 ceramics depended on the density and ionic polarization.
► The Q × f of (Mg(1−x)Nix)2SnO4 ceramics were affected by the density and internal strain.