کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1524120 1511824 2012 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Raman scattering, microstructural and dielectric studies on Ba1−xCaxBi4Ti4O15 ceramics
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
Raman scattering, microstructural and dielectric studies on Ba1−xCaxBi4Ti4O15 ceramics
چکیده انگلیسی
► Ba1−xCaxBi4Ti4O15 (0 ≤ x ≤ 1) ceramics with four-layer Aurivillius structure were fabricated. ► X-ray diffraction and Raman scattering techniques have been employed to probe into the structural changes on changing x. ► Curie temperature (TC) was found to increase with increase in Ca-doping whereas the diffuseness of phase transition decreased. ► Temperature coefficient of dielectric constant can be tuned over a wide range of temperature by changing Ca-content. ► Ferroelectric and piezoelectric properties are investigated.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Chemistry and Physics - Volume 136, Issues 2–3, 15 October 2012, Pages 680-687
نویسندگان
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