کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1527857 995396 2007 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Electrical conduction mechanism in amorphous thin films of the system PbxGe42−xSe58
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
Electrical conduction mechanism in amorphous thin films of the system PbxGe42−xSe58
چکیده انگلیسی

Bulk glasses of composition PbxGe42−xSe58 (x = 7, 8 and 9) were prepared by melt quench technique. The thermal behaviour of the glass system was investigated by differential scanning calorimetry. The double stage crystallization was observed in these glasses. Amorphous thin films of PbxGe42−xSe58 (x = 7, 8 and 9) were prepared by thermal evaporation of bulk glasses of the same composition on the glass substrates. Electrical conduction mechanism in PbxGe42−xSe58 thin films in the temperature range of 300–425 K with both symmetric and asymmetric electrodes is reported. The results were interpreted in terms of a Poole–Frenkel type of conduction mechanism over the entire range of temperatures and field strengths. Tunnel characteristics are reported in ultra thin films and the metal semiconductor interface barrier heights are determined.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Chemistry and Physics - Volume 104, Issue 1, 15 July 2007, Pages 153–157
نویسندگان
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