کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1528917 | 995722 | 2013 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Ion-beam synthesis and characterization of narrow-gap A3B5 nanocrystals in Si: Effect of implantation and annealing regimes
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Highlights
- Ion implantation and annealing were used to synthesize InAs and GaSb nanocrystals (NCs) in Si.
- Nanocrystal size is varied from 2 to 100Â nm depending on implantation and annealing regimes and on getter layer presence.
- Strain relaxation in A3B5/Si systems results in a misfit dislocation networks creation at A3B5 nanoclusters/Si interfaces.
- An anomalous bright “glowing” of nanocrystal/Si interfaces in dark-field TEM images is observed and discussed, too.
- Ion implantation and annealing were used to synthesize InAs and GaSb nanocrystals (NCs) in Si.
- Nanocrystal size is varied from 2 to 100Â nm depending on implantation and annealing regimes and on getter layer presence.
- Strain relaxation in A3B5/Si systems results in a misfit dislocation networks creation at A3B5 nanoclusters/Si interfaces.
- An anomalous bright “glowing” of nanocrystal/Si interfaces in dark-field TEM images is observed and discussed, too.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: B - Volume 178, Issue 18, 1 November 2013, Pages 1169-1177
Journal: Materials Science and Engineering: B - Volume 178, Issue 18, 1 November 2013, Pages 1169-1177
نویسندگان
F. Komarov, L. Vlasukova, O. Milchanin, W. Wesch, E. Wendler, J. Zuk, I. Parkhomenko,