Development of a very fast spectral response measurement system for analysis of hydrogenated amorphous silicon solar cells and modules

An important requirement for a very fast spectral response measurement system is the simultaneous illumination of the solar cell at multiple well defined wavelengths. Nowadays this can be done by means of light emitting diodes (LEDs) available for a multitude of wavelengths. For the purpose to measure the spectral response (SR) of amorphous silicon solar cells a detailed characterization of LEDs emitting in the wavelength range from 300 nm to 800 nm was performed. In the here developed equipment the LED illumination is modulated in the frequency range from 100 Hz to 200 Hz and the current generated by each LED is analyzed by a Fast Fourier Transform (FFT) to determine the current component corresponding to each wavelength. The equipment provides a signal to noise ratio of 2–4 orders of magnitude for individual wavelengths resulting in a precise measurement of the SR over the whole wavelength range. The difference of the short circuit current determined from the SR is less than 1% in comparison to a conventional system with monochromator.

► Spectral response equipment for measuring a-Si:H solar cells in a few seconds.
► Equipment based on 16 LEDs with simultaneous illumination of the solar cell.
► The current generated by each LED is analyzed by a Fast Fourier Transform.
► Cheap equipment without lock-in technology for the current measurement.
► Measurement error vs. conventional measurement less than 1% in Jsc.