کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1529730 1511991 2010 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Development and characterization of shape memory Cu–Zn–Al thin films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
Development and characterization of shape memory Cu–Zn–Al thin films
چکیده انگلیسی

Ternary Cu–Zn–Al alloys show good shape memory properties with narrow hysteresis and a wide range of martensitic transformation temperature (Ms), depending on the alloy composition. Thin films of Cu–Zn–Al with shape memory effect were grown for the first time using a new procedure. First Cu–Al thin films were obtained by DC sputtering on Si (1 0 0) substrates at room temperature, and second, the Cu–Al films were encapsulated and annealed in the presence of a Cu–Zn–Al bulk reference in order to fix a Zn vapour pressure. In this way a controlled amount of Zn is transported from the bulk reference into the film, in such a way that the Ms of the film becomes nearly the same as the bulk reference. The structures and microstructures of the as grown films were analysed by X-ray diffraction and transmission electron microscopy. The martensitic transformation temperature was determined by resistivity measurements.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: B - Volume 170, Issues 1–3, 15 June 2010, Pages 5–8
نویسندگان
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