کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1530189 1511989 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Application of coincidence of reciprocal lattice point model to metal/sapphire hetero interfaces
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
Application of coincidence of reciprocal lattice point model to metal/sapphire hetero interfaces
چکیده انگلیسی

Coincidence of reciprocal lattice point (CRLP) model was used to predict the stable orientation relationships of metal/α-Al2O3 hetero interfaces from geometrical considerations. The predicted stable orientation relationships (ORs) between various metals and α-Al2O3 agreed well with the experimentally observed ORs at the hetero interfaces fabricated by film growth processes. In the bcc metal/α-Al2O3 systems with different fabrication processes such as internal oxidation, Burgers and Pitsch–Schrader ORs were experimentally observed, which have not been predicted as the most stable orientation relationships by CRLP. However, these ORs are predicted in CRLP as secondary stable orientations.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: B - Volume 173, Issues 1–3, 15 October 2010, Pages 234–238
نویسندگان
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