Analysis on near field scattering spectra around nanoparticles by using parametric indirect microscopic imaging

• We have explained how Polarization parameters indirect microscopic imaging resolved the information about the near field scattering spectra around the TiAlN particle to a larger distance than the conventional optical microscopes.
• Both FDTD modeling and Polarization parametric indirect microscopic imaging measurement have proved that the parameter ϕ has much higher sensitivity to the near field scattering spectra as compared to the direct optical field intensity.
• We have detected fringes in lateral direction of ϕ experimentally as well as theoretically which can be due the evanescent field contribution.
• We have also first time imaged the near field high frequency fluctuation in about 3–4 wavelength distance from the center of the particle which give us information about polarization degree, phase, azimuthal variation and recorded much larger scattering diameter than the conventional direct microscope images.

We report the simulation and measurement results of near field spatial scattering spectra around nanoparticles. Our measurement and simulations results have indicated that Parametric Indirect Microscopic Imaging can image the near field spatial scattering to a much larger distance from the scattering source of the particle under measurement whereas this part of spatial scattering was lost in the conventional microscopy. Both FDTD modeling and measurement provided evidence that parameters of indirect optical wave vector have higher sensitivity to near field scattering.