کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1535453 | 1512627 | 2013 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
An ellipsometric surface plasmon resonance system for quantitatively determining the normal of a sensor surface and multi-channel measurement
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: An ellipsometric surface plasmon resonance system for quantitatively determining the normal of a sensor surface and multi-channel measurement An ellipsometric surface plasmon resonance system for quantitatively determining the normal of a sensor surface and multi-channel measurement](/preview/png/1535453.png)
چکیده انگلیسی
We present a three-intensity ellipsometric technique to obtain analytical solutions for the surface inclination and ellipsometric parameters under surface plasmon resonance (SPR) condition. The relation between the phase change of ellipsometric parameter and tilt angle of the test surface was obtained after a careful calibration procedure. Four-channel SPR images with different refractive indexes liquids and immobilized biomolecules were demonstrated. Also, the alignment of surface normal and the collimation of the incident light beam were examined in the measurement.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics Communications - Volume 294, 1 May 2013, Pages 8-12
Journal: Optics Communications - Volume 294, 1 May 2013, Pages 8-12
نویسندگان
Chien-Yuan Han, Chien-Wei Luo,