کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1536315 996565 2012 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Improvement of polarization extinction in silicon waveguide devices
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
Improvement of polarization extinction in silicon waveguide devices
چکیده انگلیسی

The SOI based waveguide devices are found to be highly polarization sensitive. Unwanted polarization excitations can be attenuated by integrating a TE- or TM-pass polarizer. A large attenuation of TM-polarized light has been observed when a thin film of metal is coated on the top of silicon rib waveguide, while TE-polarized light remains almost unaffected. The attenuation of TM-polarized light is attributed to the plasmonic absorption of the evanescent field in the metal cladding. Typically, with an Al cladding of thickness ∼ 100 nm and a length of 1 mm on top of a single-mode (λ ∼ 1550 nm) SOI rib waveguide structure, TE vs TM extinction ratio of ∼ 15 dB has been obtained. Integrating such waveguide polarizers in a directional coupler and MZI based DWDM channel interleaver, we have also achieved an improvement in polarization extinction by ∼ 15 dB.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics Communications - Volume 285, Issue 8, 15 April 2012, Pages 2067–2070
نویسندگان
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